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The AD5520 is a single-channel, per pin parametric measurement unit (PPMU) for use in semiconductor automatic test equipment.
2017-09-28 19:28:384

ADATE207時(shí)序發(fā)生器和格式化設(shè)備程序

The ADATE207 is a timing generator and formatter for automatic test equipment (ATE) equipment
2017-09-29 08:49:2112

S698PM芯片簡(jiǎn)介 BSD測(cè)試項(xiàng)目原理解析

;而J750是業(yè)界比較認(rèn)可測(cè)試結(jié)果的SOC芯片ATE(Automatic Test Equipment)測(cè)試機(jī),市場(chǎng)占有率非常高。下面主要介紹在J750上開發(fā)S698PM芯片BSD測(cè)試程序及注意事項(xiàng)。
2018-04-26 14:25:005990

一種選擇序列的并行折疊計(jì)數(shù)器

隨著納米工藝的發(fā)展和芯片尺寸的增大,芯片的集成度和設(shè)計(jì)復(fù)雜度越來越高,芯片測(cè)試的目標(biāo)故障、測(cè)試數(shù)據(jù)量測(cè)試應(yīng)用時(shí)間也顯著增長(zhǎng)。另一方面,昂貴的自動(dòng)測(cè)試設(shè)備( Automatic Test
2018-02-04 10:17:050

采用串行通信方式實(shí)現(xiàn)系統(tǒng)中自動(dòng)測(cè)試設(shè)備和被測(cè)單元的通信設(shè)計(jì)

在某測(cè)試系統(tǒng)的開發(fā)中,需要用數(shù)據(jù)總線來實(shí)現(xiàn)自動(dòng)測(cè)試設(shè)備(Automatic Test Equipment,簡(jiǎn)稱,ATE)和被測(cè)單元(Unit Under Test,簡(jiǎn)稱UUT)之間的串行通信。實(shí)際
2020-04-09 09:27:352593

AUTOMATIC_4P_2011年1月_日

AUTOMATIC_4P_2011年1月_日
2021-04-23 14:16:328

科通獲南京宏泰半導(dǎo)體科技頒發(fā)“年度優(yōu)秀供應(yīng)商”

近日,科通獲南京宏泰半導(dǎo)體科技頒發(fā)“年度優(yōu)秀供應(yīng)商”,在助力半導(dǎo)體測(cè)試設(shè)備市場(chǎng)上得到了行業(yè)的認(rèn)可。 南京宏泰半導(dǎo)體科技有限公司是一家專業(yè)研發(fā)半導(dǎo)體自動(dòng)測(cè)試設(shè)備(ATE,Automatic Test
2022-05-16 15:00:301883

半導(dǎo)體測(cè)試行業(yè)的相關(guān)術(shù)語(yǔ)

ATE = Automatic Test Equipment. 是自動(dòng)化測(cè)試設(shè)的縮寫,于半導(dǎo)體產(chǎn)業(yè)意指集成電路(IC)自動(dòng)測(cè)試機(jī), 用于檢測(cè)集成電路功能之完整性, 為集成電路生產(chǎn)制造之最后流程, 以確保集成電路生產(chǎn)制造之品質(zhì)。
2022-11-01 15:02:543293

歐姆龍繼電器:歐姆龍高頻繼電器在自動(dòng)檢測(cè)設(shè)備中的應(yīng)用

ATE(Automatic Test Equipment),即自動(dòng)測(cè)試設(shè)備,它是一個(gè)集成電路測(cè)試系統(tǒng),用來進(jìn)行IC測(cè)試。IC測(cè)試可分為數(shù)字電路測(cè)試、模擬電路測(cè)試和混合電路測(cè)試。其中,數(shù)字電路測(cè)試
2023-01-10 14:18:51467

Transient Load Test Board 原理圖

Transient Load Test Board 原理圖
2023-03-14 19:48:350

[TEST] [NEW] ユーザーズマニュアル  ハードウェア編

[TEST] [NEW] ユーザーズマニュアル  ハードウェア編
2023-03-17 19:45:030

Transient Load Test Board 原理圖

Transient Load Test Board 原理圖
2023-07-05 20:15:032

[TEST] [NEW] ユーザーズマニュアル  ハードウェア編

[TEST] [NEW] ユーザーズマニュアル  ハードウェア編
2023-07-07 18:36:320

ate測(cè)試系統(tǒng)是什么?為什么要選擇ate電源測(cè)試系統(tǒng)?

ate測(cè)試系統(tǒng)是什么?為什么要選擇ate電源測(cè)試系統(tǒng)? ATE測(cè)試系統(tǒng)是自動(dòng)測(cè)試設(shè)備(Automatic Test Equipment)的縮寫。它是一種用于對(duì)電子、電氣和機(jī)械產(chǎn)品進(jìn)行功能和性能測(cè)試
2023-11-07 10:01:41736

什么是開關(guān)電源效率?開關(guān)電源測(cè)試系統(tǒng)ate如何測(cè)試?

效地利用電能。 開關(guān)電源測(cè)試系統(tǒng)ATE(Automatic Test Equipment)是用于測(cè)量和評(píng)估開關(guān)電源性能的測(cè)試設(shè)備。ATE可以根據(jù)開關(guān)電源的規(guī)格和性能要求,通過多種測(cè)試方法來評(píng)估其效率。 在ATE測(cè)試中,通常需要進(jìn)行以下幾個(gè)方面的測(cè)試: 1. 輸入電流測(cè)試:通過
2023-11-10 15:29:15750

什么是ATE測(cè)試設(shè)備?都包含哪些?

ATE(Automatic Test Equipment)自動(dòng)測(cè)試設(shè)備是用于檢測(cè)電子產(chǎn)品、電氣設(shè)備的自動(dòng)化測(cè)試系統(tǒng),是電測(cè)行業(yè)首選的一種測(cè)試方式,被廣泛應(yīng)用于通信、消費(fèi)電子、汽車電子、智能家居、半導(dǎo)體、電源模塊、醫(yī)療電子、航天航空等領(lǐng)域。
2023-11-16 14:31:24783

工業(yè)測(cè)試設(shè)備的“大心臟”

設(shè)備無疑是考場(chǎng)上最嚴(yán)格的考官。 正文 廣義上的IC測(cè)試設(shè)備都可以稱為ATE(Automatic Test Equipment)。而由于測(cè)試對(duì)象 --- 芯片,有著不同的種類,測(cè)試設(shè)備也可以簡(jiǎn)單劃分為模擬ATE和數(shù)字ATE。 PART. 0 1 讓我們來簡(jiǎn)單看看ATE測(cè)試設(shè)備的用電環(huán)境。
2023-12-07 09:25:01184

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